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Nikon Instruments Introduces LV-DAF for Full System Integration with Eclipse LV Microscope Series
jul. 15, 2008
Nikon's New Dynamic Auto-Focus Unit Delivers Fast, Versatile Auto-Focus Using Novel Hybrid Auto-Focus System
Nikon Instruments Inc. announced its new Dynamic Auto-Focus unit, the LV-DAF, bringing fast, versatile auto-focus to the Eclipse LV semiconductor inspection microscope series and OEM applications. Featuring the newly developed Hybrid Auto-Focus system, the LV-DAF offers a large focus range and fast tracking ability through a combination of slit projection and contrast detection auto focus. The result is a highly-versatile system that can be used for a wide range of imaging techniques.
In pairing the two auto-focus technologies, the LV-DAF provides a focal range that is significantly larger than with contrast detection alone. This means that samples with distortion on their surface, such as liquid crystal substrate, can now be rapidly tracked, enabling speedy focusing. To further support sample variety, the LV-DAF uses a bright light LED for the auto-focus light source. This allows the system to focus on wide range of samples ranging from low to high reflectivity. A wide range of observation methods is also supported, including brightfield, darkfield and differential interference contrast (DIC), as well as reflective and transparent samples.
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'The LV microscopes are known for their unprecedented versatility for OEM applications as well as for wafer inspection,' said Mike Metzger, General Manager, Sales and Marketing. 'In developing the LV-DAF, Nikon has been able to expand those offerings even further and provide superior options to our industrial customers.'
The Auto-Adjustment Program, which is included as standard, enables simple and speedy system setup. The program performs immediate auto-adjustment after the user focuses the system and presses the button to start the setup. It is also possible to automatically set optimal parameters for each type of sample and recall them in accordance to the sample being photographed.
The LV-DAF can be controlled from a PC or a DS-L2 digital camera system for microscopes via USB or RS232C. The controller features the same hardware design as the LV-ECON and has a compact footprint that allows them to be stacked on each other and used anywhere. Additionally, Nikon provides a software development kit to help ease integration of the LV-DAF into a variety of systems.
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ABOUT NIKON INSTRUMENTS INC.
Nikon Instruments Inc. is the US microscopy arm of Nikon Healthcare, a world leader in the development and manufacture of optical and digital imaging technology for biomedical applications. For more information, visit https://www.microscope.healthcare.nikon.com/ or contact us at 1-800-52-NIKON.
Press Contact:
Kristina Corso
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SKU: Nikon Eclipse LV150NA
A motorized, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max. sample size: 150 x 150 mm.
Key benefits:
- Modularized microscope body applicable with various observations and tasks
- Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
- Easy digital imaging
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Microscope type
- Dedicated reflected illumination models
- Motorized type (Nosepiece)
Compatible stages
LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate)
*Can be fitted with LV-S32SPL ESD plate
LV-S6 6×6 stage (Stroke: 150 x 150 mm)
*Can be fi tted with LV-S6WH wafer holder / LV-S6PL ESD plate
LV-SRP P revolving stage
P-GS2 G stage 2 (Used with stage adapter LV-SAD)
LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate)
*Can be fitted with LV-S32SPL ESD plate
LV-S6 6×6 stage (Stroke: 150 x 150 mm)
*Can be fi tted with LV-S6WH wafer holder / LV-S6PL ESD plate
LV-SRP P revolving stage
P-GS2 G stage 2 (Used with stage adapter LV-SAD)
Newly developed CFI60-2 series
Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
CFI60-2 series offers higher NA and longer working distances than ever before.
Objectives for brightfield observation (epi)
Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
CFI60-2 series offers higher NA and longer working distances than ever before.
Objectives for brightfield observation (epi)
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
Compatible observation methods: Ps4 dns server cannot be used.
Brightfield | Darkfield | DIC | Fluorescence | Polarizing | Phase Contrast | Two-beam Interferometry |
° | ° | ° | ° | ° | ° |
Easy digital imaging
Digital Imaging
Information about the objective in use is detected and displayed on the camera control unit. In addition, the information is automatically converted into appropriate calibration data when changing magnification.
Digital Imaging
Information about the objective in use is detected and displayed on the camera control unit. In addition, the information is automatically converted into appropriate calibration data when changing magnification.
Digital Camera System for Microscopy Digital Sight Series
Imaging Software NIS-Elements
Imaging Software NIS-Elements
Base unit:
Maximum sample height: 38 mm (when used with LVNU5AI U5AI nosepiece and LV-S32 3×2 stage / LV-S64 6×4 stage)
* 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs
Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke
Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
* 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs
Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke
Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
Nosepieces:
LV-NU5A Motorized Universal
Quintuple Nosepiece ESD
LV-NU5AC Motorized Universal
Quintuple Nosepiece ESD
Episcopic Illuminator:
LV-UEPI-N
LV-LH50PC 12V50W Precentered Lamphouse Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable) Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, plate, excitation light balancer; equipped with noise terminator
Quintuple Nosepiece ESD
LV-NU5AC Motorized Universal
Quintuple Nosepiece ESD
Episcopic Illuminator:
LV-UEPI-N
LV-LH50PC 12V50W Precentered Lamphouse Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable) Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, plate, excitation light balancer; equipped with noise terminator
LV-UEPI2
LV-LH50PC 12V50W Precentered Lamphouse HG precentered fiber illuminator: C-HGFIE (with light adjustment) *option Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable), automated optical element switching feature matched to brightfield, darkfield, and epi-fluorescence switch Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, λ plate, excitation light balancer; equipped with noise terminator
LV-LH50PC 12V50W Precentered Lamphouse HG precentered fiber illuminator: C-HGFIE (with light adjustment) *option Bright/darkfield switch and linked aperture stop (centerable), field diaphragm (centerable), automated optical element switching feature matched to brightfield, darkfield, and epi-fluorescence switch Accepts ø 25 mm filter (NCB11, ND16, ND4), polarizer/analyzer, λ plate, excitation light balancer; equipped with noise terminator
Eyepiece tubes:
Nikon D610 Inspection And Adjustment Program
LV-TI3 trinocular eyepiece tube ESD (Erected image, FOV: 22/25)
LV-TT2 TT2 tilting trinocular eyepiece tube (Erected image, FOV: 22/25)
C-TB binocular tube (Inverted image, FOV: 22)
P-TB Binocular Tube (Inverted image, FOV: 22)
P-TT2 Trinocular Tube (Inverted image, FOV: 22)
LV-TT2 TT2 tilting trinocular eyepiece tube (Erected image, FOV: 22/25)
C-TB binocular tube (Inverted image, FOV: 22)
P-TB Binocular Tube (Inverted image, FOV: 22)
P-TT2 Trinocular Tube (Inverted image, FOV: 22)
Stages:
LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate) ESD compatible
LV-S64 6×4 stage (Stroke: 150 x 100 mm with glass plate) ESD compatible
LV-S6 6×6 stage (Stroke: 150 x 150 mm) ESD compatible
LV-S64 6×4 stage (Stroke: 150 x 100 mm with glass plate) ESD compatible
LV-S6 6×6 stage (Stroke: 150 x 150 mm) ESD compatible
Eyepieces:
CFI eyepiece series
Nikon D7100 Shooting Image Inspection And Adjustment Program
Objective lenses:
Industrial Microscope CFI60-2/CFI60 optical system Objective lens series: Combinations in accordance with the observation method
ESD performance:
1000 to 10V, within 0.2 sec. (excluding certain accessories)
Nikon Inspection And Adjustment Program Free
Power consumption:
1.2A/75W
Nikon Inspection And Adjustment Program Application
Weight:
Approximately 8.7kg
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Nikon Inspection And Adjustment Program 2017
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